Micron Introduces Radiation-Resistant Flash Storage for Space Applications

The harsh environment of outer space poses significant challenges not only for human exploration but also for electronic equipment. Traditional flash storage systems are vulnerable to extreme temperature fluctuations and radiation exposure, which can lead to device failure and data loss. In response to these challenges, Micron Technology has unveiled a specialized version of NAND flash memory designed specifically for use in space.

Spacecraft and satellites experience temperatures that can swing dramatically, ranging from nearly absolute zero at approximately -270 °C to highs of 130 °C under direct sunlight. These extreme conditions can cause stress on solder joints and other connections within electronic components. Additionally, cosmic radiation can disrupt the charge within storage cells, potentially leading to data corruption.

The new NAND flash memory from Micron aims to address these issues, boasting a compact capacity of 256 Gbit or 32 GByte per chip. Although this capacity may seem modest by current standards, the design incorporates Single Level Cell (SLC) technology, which is known for its durability and reliability.

Manufactured in the United States, these chips meet the stringent requirements necessary for deployment in critical applications, such as those conducted by NASA and the U.S. military. Micron's focus on the aerospace and defense sectors is evident from the dedicated webpage they have created for this product line.

To ensure the reliability of these chips, Micron subjects them to rigorous testing protocols, including a lengthy 590-hour burn-in test. While modern error correction techniques can mitigate many issues, the inability to replace malfunctioning storage during mission operations underscores the importance of thorough pre-launch testing.

Current flash storage solutions, including SSDs, are already utilized in space missions. For instance, a robust 8-TByte SSD produced by Phison successfully orbited the Moon during NASA's Artemis I mission, with no reported failures due to radiation or temperature extremes.